Details
1. TCO
2. Blocking/buffer layer
2-1. Material
2-1-1. Material
2-1-2. Concentration
2-1-3. Concentration Unit
2-1-4. Quantity (ml)
2-2. Solvent : (multiple solvents possible)
2-2-1. Material
2-2-2. Volume (ml)
2-3. Spin coating
2-3-1. Type
2-3-2. RPM
2-3-3. Time(s)
2-4. Vacuum suction time(s)
2-5. Annealing
2-5-1. Temperature(ºC)
2-5-2. Time(min)
2-6. Module : for blocking layer or buffer layer
2-6-1. Type
2-6-2. gap (µm)
2-6-3. coating speed (mm/s)
2-6-4. feeding amount (µl)
2-7. Thermal evaporation : for blocking layer or buffer layer
2-7-1. vacuum evaporation-thickness (nm)
2-7-2. Evaporation rate (Å/s)
2-7-3. Vacuum pressure (uTorr)
3. Surface Treatment1
4. ETL
4-1. Material : for ETL
4-1-1. Material
4-1-2. Concentration
4-1-3. Concentration Unit
4-1-4. Quantity (ml)
4-2. Solvent : (multiple solvents possible) : for ETL
4-2-1. Material
4-2-2. Volume (ml)
4-3. Spin coating : for ETL
4-3-1. Type
4-3-2. RPM
4-3-3. Time(s)
4-4. Vacuum suction time(s) : for ETL
4-5. Annealing : for ETL
4-5-1. Temperature (ºC)
4-5-2. Time(min)
4-6. ETL doping
4-6-1. Material
4-6-2. Volume (ul)
4-7. Module : for ETL
4-7-1. Type
4-7-2. gap (µm)
4-7-3. coating speed (mm/s)
4-7-4. feeding amount (µl)
4-8. Thermal evaporation: for ETL
4-8-1. vacuum evaporation-thickness (nm)
4-8-2. Evaporation rate (Å/s)
4-8-3. Vacuum pressure (uTorr)
4-9. Chemical Bath Deposition: for ETL
4-9-1. Solution
4-9-2. Quantity (ml)
4-9-3. Bath annealing Temperature (ºC)
4-9-4. Bath annealing Time(hr)
4-10. Sputtering : for ETL
4-10-1. Target material
4-10-2. Base pressure (uTorr)
4-10-3. Working pressure (mTorr)
4-10-4. Ar/O2 ratio
4-10-5. Deposition rate (Å/s)
4-10-6. Deposition thickness (nm)
4-10-7. RF power (W)
4-10-8. DC power current (mA)
4-10-9. DC power voltage (V)
5. ETL Treatment
5-1. Material : for ETL Treatment
5-1-1. Material
5-1-2. Concentration
5-1-3. Concentration Unit
5-1-4. Quantity (ml)
5-2. Solvent : (multiple solvent blocks possible) : for ETL Treatment
5-2-1. Material
5-2-2. Volume (ml)
5-3. Spin coating : for ETL Treatment
5-3-1. Type
5-3-2. RPM
5-3-3. Time(s)
5-4. Vacuum suction time(s) : for ETL Treatment
5-5. Annealing : for ETL Treatment
5-5-1. . Temperature (ºC)
5-5-2. Time(min)
5-6. Module : for ETL Treatment
5-6-1. Type
5-6-2. gap (µm)
5-6-3. coating speed (mm/s)
5-6-4. feeding amount (µl)
5-7. Thermal evaporation : for ETL Treatment
5-7-1. vacuum evaporation-thickness (nm)
5-7-2. Evaporation rate (Å/s)
5-7-3. Vacuum pressure (uTorr)
6. Surface Treatment2
7. Perovskite
7-1. Method
7-2. Molarity
7-3. A-site : multiple blocks possible
7-3-1. Material : for A site
7-3-2. Ratio (%)
7-4. B-site : multiple blocks possible
7-4-1. Material : for B site
7-4-2. Ratio (%)
7-5. X-site : multiple blocks possible
7-5-1. Material : for X site
7-5-2. Ratio (%)
7-6. Solvent : for Perovskite (multiple blocks possible)
7-6-1. Material
7-6-2. Volume (ml)
7-7. Additive : for Perovskite (multiple blocks possible)
7-7-1. Material
7-7-2. Solvent
7-7-3. Concentration
7-7-4. Concentration Unit
7-7-5. Quantity (mol%)
7-8. Stirring Time (min)
7-9. Antisolvent : for Perovskite
7-9-1. Material
7-9-2. Quantity (µl)
7-9-3. Dripping time (s)
7-10. Spin coating : for Perovskite
7-10-1. Type
7-10-2. RPM
7-10-3. Time(s)
7-11. Annealing : for Perovskite
7-11-1. Temperature (ºC)
7-11-3. Time(min)
7-12. Atmosphere
7-12-1. Type
7-12-1. Temperature (ºC)
7-12-3. Humidity (RH%)
7-13. Assist : for Perovskite
7-13-1. Type
7-13-2. Temperature (ºC)
7-13-3. Assist start time (s)
7-13-4. Total assist time (s)
7-14. Module : for Perovskite
7-14-1. Type
7-14-2. gap (µm)
7-14-3. coating speed (mm/s)
7-14-4. feeding amount (µl)
7-15. Thermal evaporation : for Perovskite
7-15-1. vacuum evaporation-thickness (nm)
7-15-2. Evaporation rate (Å/s)
7-15-3. Vacuum pressure (uTorr)
8. Perovskite Treatment
8-1. Material : for Perovskite Treatment
8-1-1. Material
8-1-2. Concentration
8-1-3. Concentration Unit
8-1-4. Quantity (ml)
8-2. Solvent : for Perovskite Treatment (multiple blocks possible)
8-2-1. Material
8-2-2. Volume (ml)
8-3. Spin coating : for Perovskite Treatment
8-3-1. Type
8-3-2. RPM
8-3-3. Time(s)
8-4. Vacuum suction time(s) : for Perovskite Treatment
8-5. Annealing : for Perovskite Treatment
8-5-1. Temperature (ºC)
8-5-2. Time(min)
8-6. Module : for Perovskite Treatment
8-6-1. Type
8-6-2. gap (µm)
8-6-3. coating speed (mm/s)
8-6-4. feeding amount (µl)
8-7. Thermal evaporation : for Perovskite Treatment
8-7-1. vacuum evaporation-thickness (nm)
8-7-2. Evaporation rate (Å/s)
8-7-3. Vacuum pressure (uTorr)
9. HTL
9-1. Material : for HTL
9-1-1. Material
9-1-2. Concentration
9-1-3. Concentration Unit
9-1-4. Quantity (ml)
9-2. Solvent : multiple blocks possible : for HTL
9-2-1. Material
9-2-2. Volume (ml)
9-3. Spin coating : for HTL
9-3-1. Type
9-3-2. RPM
9-3-3. Time(s)
9-4. Vacuum suction time(s) : for HTL
9-5. Annealing : for HTL
9-5-1. Temperature (ºC)
9-5-2. Time(min)
9-6. HTL doping
9-6-1. Material
9-6-2. Volume (ul)
9-7. Module : for HTL
9-7-1. Type
9-7-2. gap (µm)
9-7-3. coating speed (mm/s)
9-7-4. feeding amount (µl)
9-8. Thermal evaporation : for HTL
9-8-1. vacuum evaporation-thickness (nm)
9-8-2. Evaporation rate (Å/s)
9-8-3. Vacuum pressure (uTorr)
10. HTL Treatment
10-1. Material : for HTL Treatment
10-1-1. Material
10-1-2. Concentration
10-1-3. Concentration Unit
10-1-4. Quantity (ml)
10-2. Solvent : multiple blocks possible: for HTL Treatment
10-2-1. Material
10-2-2. Volume (ml)
10-3. Spin coating : for HTL Treatment
10-3-1. Type
10-3-2. RPM
10-3-3. Time(s)
10-4. Vacuum suction time(s) : for HTL Treatment
10-5. Annealing : for HTL Treatment
10-5-1. Temperature (ºC)
10-5-2. Time(min)
10-6. Module : for HTL Treatment
10-6-1. Type
10-6-2. gap (µm)
10-6-3. coating speed (mm/s)
10-6-4. feeding amount (µl)
10-7. Thermal evaporation : for HTL Treatment
10-7-1. vacuum evaporation-thickness (nm)
10-7-2. Evaporation rate (Å/s)
10-7-3. Vacuum pressure (uTorr)
11. Anode metal
11-1. Anode Metal : Material for Anode
12. Miscellaneous
12-1 Note
12-2. AR
12-3. Type
12-4. Device Type
12-5. Temperature (ºC)
12-6. Humidity (%)
12-7. Cell Dimension (cm2)
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